A new double data rate (DDR) memory simulation capability is part of the PathWave Advanced Design System (ADS) 2019. The new capability makes it easy for developers to compare simulated data with actual measured results, reducing the time required to complete product development workflows.
DDR memory designs grow more complex with each new generation, and simulation and test configuration also grow in complexity, resulting in longer simulation and test setup times. The added complexity makes it harder to correlate simulation and test data, resulting in less confidence in designs, longer troubleshooting cycles, and missed delivery schedules. PathWave ADS Memory Designer connects simulation and test workflows, addressing common DDR memory design challenges with new workflows that automate routine tasks and harness data analytics to gain faster actionable insight into simulation data.
PathWave is software that enables agile and connected design and test. It accelerates product development by modernizing engineering workflows, connecting simulation and measurement data throughout the design, test, and manufacturing lifecycle. It incorporates advanced analytics that creates immediate, actionable insights for development and manufacturing teams. PathWave ensures product development teams can keep up with increasing product complexity while decreasing test time and development costs.
Keysight PathWave helps customers accelerate engineering workflows through powerful software that enables agile, connected design and test, featuring:
- Open APIs and open source components that enable customers to customize the platform and integrate with their current hardware and software.
- A scalable architecture that provides the flexibility to run computations on a dedicated workstation, in the public or private cloud, or on embedded instrument software.
- Flexible consumption models that let companies utilize software when and where they need it.
- Best-in-class measurement science that produces consistent, accurate results across design, test, and manufacturing environments.