Artificial intelligence (AI) and machine learning (ML) continue to push the limits of conventional semiconductor architectures. To increase speeds, lower latency, and optimize power consumption for high-performance workloads, semiconductor companies, and research institutions are developing advanced photonic chips that operate on the principles of light rather than electrical currents. This article discusses the limitations of […]
How to minimize design cycles for AI accelerators with advanced DFT and silicon bring-up
Design for testability (DFT) embeds testable features into an integrated circuit (IC) during design, while silicon bring-up initiates chip evaluation and debugging. Streamlining these sequential processes minimizes design cycles and shortens time-to-market (TTM) for advanced artificial intelligence (AI) accelerators. This article explores the complexities of AI chip design and outlines strategies for optimizing DFT and […]
How to test IoT device wireless capabilities
Testing the wireless capabilities of IoT devices before production helps ensure reliable connectivity, optimal performance, and seamless integration across a wide range of applications. This article reviews key IoT wireless parameters and highlights Wi-Fi, 5G, and Bluetooth LE testing priorities. It also discusses how wireless testing supports optimal LPWAN and ZigBee IoT device functionality. Analyzing […]
How to integrate theft-prevention tracking capabilities in IoT devices
Microcontrollers and wireless modules combine to add connectivity and theft-prevention features to IoT devices for automotive, industrial, medical, and smart-home use. Many original equipment manufacturers (OEMs) integrate theft-prevention tracking capabilities into their IoT devices. This article reviews key trade-offs and considerations for selecting wireless tracking technologies and highlights the crucial role microcontroller units (MCUs) play […]
